Nanobeam X-Ray Scattering. Probing Matter at the Nanoscale. Julian Stangl и др.
- Тип: Текст PDF
- Авторы:
- Издательство: John Wiley & Sons Limited(2018)
- ISBN: 9783527655090
- Страниц: 284
- Язык: Английский
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- Жанры: Техническая литература
- Описание
A comprehensive overview of the possibilities and potential of X-ray scattering using nanofocused beams for probing matter at the nanoscale, including guidance on the design of nanobeam experiments. The monograph discusses various sources, including free electron lasers, synchrotron radiation and other portable and non-portable X-ray sources. For scientists using synchrotron radiation or students and scientists with a background in X-ray scattering methods in general.