Measurement Technology for Micro-Nanometer Devices. Jingdong Chen и др.

- Тип: Текст PDF
- Авторы:
- Издательство: John Wiley & Sons Limited(2018)
- ISBN: 9781118717981
- Страниц: 344
- Язык: Английский
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- Жанры: Электроника
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A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale • Highlights the advanced research work from industry and academia in micro-nano devices test technology • Written at both introductory and advanced levels, provides the fundamentals and theories • Focuses on the measurement techniques for characterizing MEMS/NEMS devices